Nová generace integrace mikroskopie atomárních sil a elektronové mikroskopie

Next Generation of Integrated Atomic Force and Scanning Electron Microscopy

grant

Hardware upgrades, software development, application development, technology transfer

NenoVision LiteScope on both internal and external markets with next-generation devices and accessories. Innovation will focus on the three areas that make up the project's sub-goals:
a) Hardware upgrade of equipment - development of new HW modules enabling: sample rotation, sample cooling and sample heating and sample and probe loading via so-called electron microscope load.
(b) software development of methods and procedures for processing analyzes produced by multi-level correlation analysis techniques
c) development of applications and applications using AFM / SEM correction techniques using newly developed hardware and software modules
d) effective cooperation between partners and technology transfer

Herout Adam, prof. Ing., Ph.D. (DCGM FIT BUT) , research leader
Bartl Vojtěch, Ing., Ph.D. (DCGM FIT BUT)
Čiháková Lucie, Ing. (RCIT FIT BUT)
Kocur Viktor, Ing., Ph.D. (DCGM FIT BUT)
Nguyen Son Hai, Ing. (FIT BUT)
Nguyen Son Hai, Ing. (DCGM FIT BUT)
Špaňhel Jakub, Ing., Ph.D. (DCGM FIT BUT)
Vaško Marek, Ing. (DCGM FIT BUT)
Zachariáš Michal, Ing., Ph.D. (DCGM FIT BUT)