Publication Details
Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations
Herout Adam, prof. Ing., Ph.D. (DCGM FIT BUT)
Dubská Markéta, Ing., Ph.D. (DCGM FIT BUT)
line parameterization, Hough transform, vanishing points, camera calibration
Some variants of the Hough transform can be used for detecting vanishing points and groups of concurrent lines. This article addresses a common misconception that in the polar line parameterization the vanishing point is represented by a line. The numerical error caused by this inaccuracy is then estimated.
The article studies in detail point-to-line-mappings (PTLMs) -- a class of line parameterizations which have the property that the vanishing point is represented by a line (and thus can be easily searched for). When a PTLM parameterization is used for the straight line detection by the Hough transform, a pair or a triplet of complementary PTLMs has to be used in order to obtain a limited Hough space. The complementary pairs and triplets of PTLMs are formalized and discussed in this article.
@ARTICLE{FITPUB10242, author = "Ji\v{r}\'{i} Havel and Adam Herout and Mark\'{e}ta Dubsk\'{a}", title = "Vanishing Points in Point-to-Line Mappings and Other Line Parameterizations", pages = "703--708", journal = "Pattern Recognition Letters", volume = 2013, number = 34, year = 2013, ISSN = "0167-8655", doi = "10.1016/j.patrec.2013.01.020", language = "english", url = "https://www.fit.vut.cz/research/publication/10242" }