Publication Details
Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability
Bolchini Cristiana (Polimi)
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
ATPG, funkční verifikace.
As the complexity of current hardware systems rises rapidly, it is a challenging task to harden these systems against faults and to complete their verification and manufacturing test. Not only that verification and testing take a considerable amount of time but the number of design errors, faults, manufacturing defects and crosstalks increases with the rising complexity as well. Furthermore, when a system is designed to be reliable new issues come into play making the picture even more complex. In this paper we performed a detailed analysis of two approaches
devoted to verification of hardened systems, with respect to the
test set generation: the first one is based on classical Automatic
Test Pattern Generation, the second one on Constrained-random
Stimulus Generation. We evaluated their qualities as well as their
drawbacks and introduced few ideas about their combination
in order to create a new promising approach for verification of
reliable systems.
@INPROCEEDINGS{FITPUB10274, author = "Marcela Zachari\'{a}\v{s}ov\'{a} and Cristiana Bolchini and Zden\v{e}k Kot\'{a}sek", title = "Analysis and Comparison of Functional Verification and ATPG for Testing Design Reliability", pages = "275--278", booktitle = "IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits and Systems", year = 2013, location = "Karlovy Vary, CZ", publisher = "IEEE Computer Society", ISBN = "978-1-4673-6133-0", language = "english", url = "https://www.fit.vut.cz/research/publication/10274" }