Publication Details
IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Fey Görschwin (UNIBRE)
Raik Jaan (TTÜ)
Aunet Snorre (NTNU)
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY FIT BUT)
The IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems. The DDECS Symposium series has been organized by these European countries: Czech Republic (1997, 2002, 2006, 2009), Poland (1998, 2003, 2007), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), Austria (2010), Germany (2011) and Estonia (2012). DDECS 2013 will take place in Karlovy Vary (Carlsbad), a historically known spa city located about 140 km west of Prague. The Symposium is organized by Brno University of Technology, Faculty of Information Technology, and sponsored by the Test Technology Technical Council (TTTC) of theIEEE Computer Society.
@PROCEEDINGS{FITPUB10336, editor = "Luk\'{a}\v{s} Sekanina and G{\"{o}}rschwin Fey and Jaan Raik and Snorre Aunet and Richard R\r{u}\v{z}i\v{c}ka", title = "IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits \& Systems", pages = 300, year = 2013, location = "Brno, CZ", publisher = "IEEE Computer Society", ISBN = "978-1-4673-6133-0", language = "english", url = "https://www.fit.vut.cz/research/publication/10336" }