Publication Details
Universal Pseudo-random Generation of Assembler Codes for Processors
Zachariášová Marcela, Ing., Ph.D. (DCSY FIT BUT)
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
universal generator, assembler, processor, functional verification
The paper describes a universal generation of test stimuli based on solving constraints. The architecture of the universal generator consists of two formal models. The first one is used for describing the generated scenario and the second one for specifying constraints for this scenario. The generation of the assembler programs for Application-Specific Instruction-set Processors (ASIPs) is an example of the use of this architecture. The necessary steps needed to generate a valid assembler code are described. The quality of the generator is measured by the instruction and statement coverage in functional verification.
@INPROCEEDINGS{FITPUB10882, author = "Ond\v{r}ej \v{C}ekan and Marcela Zachari\'{a}\v{s}ov\'{a} and Zden\v{e}k Kot\'{a}sek", title = "Universal Pseudo-random Generation of Assembler Codes for Processors", pages = "70--73", booktitle = "Proceedings of The Third Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale", year = 2015, location = "Grenoble, FR", publisher = "COST, European Cooperation in Science and Technology", language = "english", url = "https://www.fit.vut.cz/research/publication/10882" }