Publication Details

Advanced VLSI Circuits Simulation

KOCINA Filip and KUNOVSKÝ Jiří. Advanced VLSI Circuits Simulation. In: Proceedings of the 2017 International Conference on High Performance Computing & Simulation (HPCS 2017). Genoa: Institute of Electrical and Electronics Engineers, 2017, pp. 526-533. ISBN 978-1-5386-3250-5. Available from: https://ieeexplore.ieee.org/document/8035123
Czech title
Pokročilá simulace VLSI obvodů
Type
conference paper
Language
english
Authors
URL
Keywords

circuit simulation, VLSI circuits, Taylor series method, initial value problems

Abstract

The paper deals with very accurate and effective simulation of Complementary Metal-Oxide-Semiconductor (CMOS) transistors which are used to construct basic logic gates (inverter, NAND and NOR) and their composites (XOR, AND, OR). The transistors are substituted by a resistor-capacitor (RC) circuit and the circuit is described by a system of differential algebraic equations (DAEs). These equations are numerically solved by the variable-step, variable-order Modern Taylor Series Method (MTSM). The same approach can be used for VLSI simulation - it was implemented by the corresponding author in a general purpose programming language. This approach is faster than the state of the art (SPICE) and uses less memory.

Published
2017
Pages
526-533
Proceedings
Proceedings of the 2017 International Conference on High Performance Computing & Simulation (HPCS 2017)
Conference
The 2017 International Conference on High Performance Computing & Simulation (HPCS 2017), Janov, IT
ISBN
978-1-5386-3250-5
Publisher
Institute of Electrical and Electronics Engineers
Place
Genoa, IT
DOI
UT WoS
000425930800071
EID Scopus
BibTeX
@INPROCEEDINGS{FITPUB11406,
   author = "Filip Kocina and Ji\v{r}\'{i} Kunovsk\'{y}",
   title = "Advanced VLSI Circuits Simulation",
   pages = "526--533",
   booktitle = "Proceedings of the 2017 International Conference on High Performance Computing \& Simulation (HPCS 2017)",
   year = 2017,
   location = "Genoa, IT",
   publisher = "Institute of Electrical and Electronics Engineers",
   ISBN = "978-1-5386-3250-5",
   doi = "10.1109/HPCS.2017.84",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/11406"
}
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