Publication Details

Random Test Generation Through a Probabilistic Constrained Grammar

ČEKAN Ondřej and KOTÁSEK Zdeněk. Random Test Generation Through a Probabilistic Constrained Grammar. In: INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems. Budapešť, 2018, pp. 5-8.
Type
conference paper
Language
english
Authors
Čekan Ondřej, Ing., Ph.D. (DCSY FIT BUT)
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
Abstract

The paper introduces a probabilistic constrained grammar which is a newly formed grammar system for the use in the area of test stimuli generation. The grammar extends the existing probabilistic context-free grammar and establishes constraints for the grammar limitations. Stimuli obtained through the proposed principle are used in functional verification of a RISC processor and the coverage metric is evaluated. The paper also contains examples of how to define a problem of assembly code generation for processors.

Published
2018
Pages
5-8
Proceedings
INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems
Conference
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2018, Hotel NH Budapest City, Budapešť, HU
Place
Budapešť, HU
BibTeX 
@INPROCEEDINGS{FITPUB11605,
   author = "Ond\v{r}ej \v{C}ekan and Zden\v{e}k Kot\'{a}sek",
   title = "Random Test Generation Through a Probabilistic Constrained Grammar",
   pages = "5--8",
   booktitle = "INFORMAL PROCEEDINGS 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
   year = 2018,
   location = "Budape\v{s}\v{t}, HU",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/11605"
}
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