Publication Details

Smart Electronic Locks and Their Reliability

ČEKAN Ondřej, PODIVÍNSKÝ Jakub, LOJDA Jakub, PÁNEK Richard, KRČMA Martin and KOTÁSEK Zdeněk. Smart Electronic Locks and Their Reliability. In: Proceedings of the 7th Prague Embedded Systems Workshop. Roztoky u Prahy: Czech Technical University, 2019, pp. 4-5. ISBN 978-80-01-06607-2. Available from: http://pesw.fit.cvut.cz/2019/PESW_2019.pdf
Czech title
Chytré elektronické zámky a jejich spolehlivost
Type
conference paper
Language
english
Authors
Čekan Ondřej, Ing., Ph.D. (DCSY FIT BUT)
Podivínský Jakub, Ing., Ph.D. (DCSY FIT BUT)
Lojda Jakub, Ing., Ph.D. (DCSY FIT BUT)
Pánek Richard, Ing. (DCSY FIT BUT)
Krčma Martin, Ing. (DCSY FIT BUT)
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
URL
Keywords

Electronic Lock, Stepper Motor, FPGA, Fault Tolerance, Stimuli Generation, Reconfiguration

Abstract

This research paper presents the analysis of electronic smart locks and explores the influences of faults on its controller unit. Electronic smart locks often utilize stepper motor as an actuator. Stepper motors, however, need a controller, which is usually implemented in a processor. The aim of our research is to examine the consequences of failing controller processor. In our previous research, we developed a platform for fault tolerance testing with the ability to monitor the impacts on the mechanical part. We also developed a framework for accelerated testing of fault tolerance properties. The processor can be implemented in an FPGA (Field Programmable Gate Array) in order to be able to emulate HW faults inside the processor. In this paper, the concept of testing a smart lock is presented alongside with the first experimental results utilizing direct generation of invalid stimuli for the stepper motor. In our research, we found out, that random errors probably could not be used to unauthorized unlock, especially if the lock utilizes a mechanical gearbox. Deeper logic and knowledge of the correct sequence of steps used by the selected motor are needed to perform the attack to unlock the lock. On the other hand, random sequences could cause that the lock will not be locked by falsifying the lock request sequence. The second interesting fact is that  x % of faults in the valid sequence give the same rotation angle as 100-x % of faults.

Published
2019
Pages
4-5
Proceedings
Proceedings of the 7th Prague Embedded Systems Workshop
Conference
The 7th Prague Embedded Systems Workshop, Roztoky u Prahy, CZ
ISBN
978-80-01-06607-2
Publisher
Czech Technical University
Place
Roztoky u Prahy, CZ
BibTeX 
@INPROCEEDINGS{FITPUB11997,
   author = "Ond\v{r}ej \v{C}ekan and Jakub Podiv\'{i}nsk\'{y} and Jakub Lojda and Richard P\'{a}nek and Martin Kr\v{c}ma and Zden\v{e}k Kot\'{a}sek",
   title = "Smart Electronic Locks and Their Reliability",
   pages = "4--5",
   booktitle = "Proceedings of the 7th Prague Embedded Systems Workshop",
   year = 2019,
   location = "Roztoky u Prahy, CZ",
   publisher = "Czech Technical University",
   ISBN = "978-80-01-06607-2",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/11997"
}
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