Detail publikace

DEMIS: Electron Microscopy Image Stitching using Deep Learning Features and Global Optimisation

ŠILLING Petr a ŠPANĚL Michal. DEMIS: Electron Microscopy Image Stitching using Deep Learning Features and Global Optimisation. In: Proceedings of the 18th International Joint Conference on Biomedical Engineering Systems and Technologies - BIOIMAGING. Porto: Institute for Systems and Technologies of Information, Control and Communication, 2025, s. 255-256. ISBN 978-989-758-731-3. Dostupné z: https://www.scitepress.org/publishedPapers/2025/133149/pdf/index.html
Název česky
DEMIS: Sešívání obrazů z elektronového mikroskopu pomocí hlubokého učení a globální optimalizace
Typ
článek ve sborníku konference
Jazyk
angličtina
Autoři
Šilling Petr, Ing. (UPGM FIT VUT)
Španěl Michal, doc. Ing., Ph.D. (UPGM FIT VUT)
URL
Rok
2025
Strany
255-256
Sborník
Proceedings of the 18th International Joint Conference on Biomedical Engineering Systems and Technologies - BIOIMAGING
Konference
12th International Conference on Bioimaging, BIOIMAGING 2025 - Part of 18th International Joint Conference on Biomedical Engineering Systems and Technologies, BIOSTEC 2025, Porto, PT
ISBN
978-989-758-731-3
Vydavatel
Institute for Systems and Technologies of Information, Control and Communication
Místo
Porto, PT
DOI
10.5220/0013314900003911
BibTeX 
@INPROCEEDINGS{FITPUB13335,
   author = "Petr \v{S}illing and Michal \v{S}pan\v{e}l",
   title = "DEMIS: Electron Microscopy Image Stitching using Deep Learning Features and Global Optimisation",
   pages = "255--256",
   booktitle = "Proceedings of the 18th International Joint Conference on Biomedical Engineering Systems and Technologies - BIOIMAGING",
   year = 2025,
   location = "Porto, PT",
   publisher = "Institute for Systems and Technologies of Information, Control and Communication",
   ISBN = "978-989-758-731-3",
   doi = "10.5220/0013314900003911",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/13335"
}
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