Publication Details

Test Overhead Reduction through RT Level Testability Analysis

HLAVIČKA Jan, KOTÁSEK Zdeněk and ZBOŘIL František. Test Overhead Reduction through RT Level Testability Analysis. In: Proceedings of the IEEE ETW 1997. Cagliary: unknown, 1997, pp. 43-47.
Czech title
Test Overhead Reduction through RT Level Testability Analysis
Type
conference paper
Language
english
Authors
Hlavička Jan, Prof. Ing., DrSc. (FEE CTU)
Kotásek Zdeněk, Doc. Ing., CSc. (DCSE FEECS BUT)
Zbořil František, Doc. Ing., CSc. (DCSE FEECS BUT)
Keywords

Design for Testability, RT Level Testability Analysis, RT Level Element Classification, Test Application

Abstract

The paper presents a new method of formal testability analysis made on the RT level in PROLOG environment. This analysis is based on a model which classifies the RT level elements into categories by their function during the testing. The results of the analysis are used for designing a combined test mode in which elements accessible through I-paths are tested with a sequence of parallel test vectors whereas the serial scan method is used only for the remaining elements. This leads to savings both in test application time and in chip area overhead.

Published
1997
Pages
43-47
Proceedings
Proceedings of the IEEE ETW 1997
Conference
IEEE ETW'97 (European Test Workshop), Cagliary, IT
Place
Cagliary, IT
BibTeX 
@INPROCEEDINGS{FITPUB6594,
   author = "Jan Hlavi\v{c}ka and Zden\v{e}k Kot\'{a}sek and Franti\v{s}ek Zbo\v{r}il",
   title = "Test Overhead Reduction  through RT Level Testability Analysis",
   pages = "43--47",
   booktitle = "Proceedings of the IEEE ETW 1997",
   year = 1997,
   location = "Cagliary, IT",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/6594"
}
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