Publication Details

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

STRNADEL Josef and KOTÁSEK Zdeněk. Normalized Testability Measures at RT Level: Utilization and Reasons for Creation. In: Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems. Vol. I.. Ostrava, 2002, pp. 297-304. ISBN 80-85988-71-2.
Czech title
Normalizované Míry Testovatelnosti na RT úrovni popisu: Použití a důvody k vytvoření
Type
conference paper
Language
english
Authors
Strnadel Josef, Ing., Ph.D. (DCSY FIT BUT)
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
Keywords

Register-transfer level, controllability, observability, testability, testability analysis

Abstract

The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.

Published
2002
Pages
297-304
Proceedings
Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems
Series
Vol. I.
Conference
36th Spring International Conference MOSIS 2002 Modelling and Simulation of Systems , Rožnov pod Radhoštěm, CZ
ISBN
80-85988-71-2
Place
Ostrava, CZ
BibTeX 
@INPROCEEDINGS{FITPUB6917,
   author = "Josef Strnadel and Zden\v{e}k Kot\'{a}sek",
   title = "Normalized Testability Measures at RT Level: Utilization and Reasons for Creation",
   pages = "297--304",
   booktitle = "Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems",
   series = "Vol. I.",
   year = 2002,
   location = "Ostrava, CZ",
   ISBN = "80-85988-71-2",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/6917"
}
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