Publication Details

Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level

STRNADEL Josef and KOTÁSEK Zdeněk. Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level. In: Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002. Los Alamitos: IEEE Computer Society Press, 2002, pp. 166-173. ISBN 0-7695-1790-0.
Czech title
Zlepšení testovatelnosti založené na kombinaci analytických a evolučních přístupů na RT úrovni popisu
Type
conference paper
Language
english
Authors
Strnadel Josef, Ing., Ph.D. (DCSY FIT BUT)
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
Keywords

design for testability, scan technique, scan register, scan chain, state-space analysis, evolutionary approach, genetic algorithm

Abstract

In the paper a new heuristic approach to the RTL testability analysis is presented. It is shown how the values of controllability/observability factors reflecting the structure of the circuit and other factors can be utilised to find solutions which are sub-optimal but still acceptable for the designer. The goal of the methodology is to enable the identification of such testability solutions which satisfy concrete requirements in terms of the number of registers included into the scan chain, the area overhead and the test application time as a result of RTL testability analysis. The approach is based on the combination of analytical and evolutionary approaches at the RT level.

Published
2002
Pages
166-173
Proceedings
Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002
Conference
EUROMICRO Symposium on Digital System Design: Architecture, Methods and Tools, Dortmund, DE
ISBN
0-7695-1790-0
Publisher
IEEE Computer Society Press
Place
Los Alamitos, US
BibTeX 
@INPROCEEDINGS{FITPUB6980,
   author = "Josef Strnadel and Zden\v{e}k Kot\'{a}sek",
   title = "Testability Improvements Based on the Combination of Analytical and Evolutionary Approaches at RT Level",
   pages = "166--173",
   booktitle = "Proceedings of Euromicro Symposium on Digital System Design Architectures, Methods and Tools DSD'2002",
   year = 2002,
   location = "Los Alamitos, US",
   publisher = "IEEE Computer Society Press",
   ISBN = "0-7695-1790-0",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/6980"
}
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