Publication Details

Proceedings of 5th International Workshop IEEE Design and Diagnostics of Electronic Circuits and Systems

HLAVIČKA Jan, KOTÁSEK Zdeněk, MARINISSEN Erik Jan, NOVÁK Ondřej, RŮŽIČKA Richard and STRAUBE Bernd, ed. Proceedings of 5th International Workshop IEEE Design and Diagnostics of Electronic Circuits and Systems. Brno: Faculty of Information Technology BUT, 2002. ISBN 80-214-2094-4.
Czech title
Sborník 5. mezinárodního workshopu IEEE Design and Diagnostics of Electronic Circuits and Systems
Type
conference proceedings
Language
english
Authors
Hlavička Jan, Prof. Ing., DrSc. (FEE CTU)
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
Marinissen Erik Jan (philips-reslab)
Novák Ondřej, Prof. Ing., CSc. (TUL-FMECH)
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY FIT BUT)
Straube Bernd, Dr. Ing. habil. (Fraunhofer IIS)
Keywords

design, diagnostics, electronic circuits

Abstract

The Design and Diagnostics of Electronic Circuits and Systems workshops (DDECS) have annually been held in the Central-European Countries Poland, Czech Republic, Slovakia, and Hungary. As a key feature the DDECS Workshops offer researchers from industry and academia a forum to present and discuss topics both in design and in diagnostics. In response to the Call for Papers this 5th IEEE DDECS Workshop received 79 submissions from 27 countries. The international program committee chaired by Erik Jan Marinissen from Philips, The Netherlands, selected 30 papers for oral presentation and 30 poster presentations. The selection was based on the evaluations done by 40 reviewers from 17 countries. In the nine paper sessions many aspects in ASIC, FPGA, IP-based, and SOC design are covered, hardware-software co-design and bio-inspired hardware are addressed as well as testability, digital and analog testing approaches are presented. Between the paper sessions there are the poster sessions that offer the participants of the DDECS workshop further opportunities to discuss their problems and to refresh and make contacts with other specialists. The first two days of the workshop start with keynote sessions. In correspondence with the two main topics of the DDECS workshop one of the invited speakers, Rainer Hartenstein, University of Kaiserslautern, Germany, addresses the design field and the other, Bernd Koenemann, IBM Microelectronics, San Jose, U.S.A, the field of testing. We would like to thank all the volunteers. They have done an excellent job in the Organizing Committee, the Program Committee, the Steering Committee, or as reviewers. Their efforts have made the 5th IEEE DDECS Workshop an outstanding event in Central-Europe. Moreover, the DDECS Workshop has become very much a part of the international design and test community.

Published
2002
Pages
427
Conference
IEEE Design and Diagnostics of Electronic Circuits and Systems 2002, Brno, CZ
ISBN
80-214-2094-4
Publisher
Faculty of Information Technology BUT
Place
Brno, CZ
BibTeX 
@PROCEEDINGS{FITPUB7037,
   editor = "Jan Hlavi\v{c}ka and Zden\v{e}k Kot\'{a}sek and Jan Erik Marinissen and Ond\v{r}ej Nov\'{a}k and Richard R\r{u}\v{z}i\v{c}ka and Bernd Straube",
   title = "Proceedings of 5th International Workshop IEEE Design and Diagnostics of Electronic Circuits and Systems",
   pages = 427,
   year = 2002,
   location = "Brno, CZ",
   publisher = "Faculty of Information Technology BUT",
   ISBN = "80-214-2094-4",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7037"
}
Back to top