Publication Details

Methodologies of RTL Partial Scan Analysis and Their Comparison

KOTÁSEK Zdeněk, MIKA Daniel and STRNADEL Josef. Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. In: Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. Poznaň: Publishing House of Poznan University of Technology, 2003, pp. 233-238. ISBN 83-7143-557-6.
Czech title
Sbroník IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
Type
conference paper
Language
english
Authors
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
Mika Daniel, Ing. (DCSY FIT BUT)
Strnadel Josef, Ing., Ph.D. (DCSY FIT BUT)
Keywords

Register Transfer Level, Feedback Loop, Genetic Algorithm

Abstract

In the paper, two different methodologies for the identification of registers to be included into the partial scan chain and principles of their implementation are described briefly. One of them is based on the utilisation of genetic algorithms, the other one on the identification of feedback loops. An attention is paid to the computation of time and space complexities of the developed algorithms. The possibility of the complete state-space exploration (all possible scan chain configurations) is also discussed. It is derived that algorithms based on genetic algorithms allow to gain sub-optimal solutions while fulfilling user requirements. The combination of both methodologies is investigated and the complexities analysed. Experimental results are described.

Published
2003
Pages
233-238
Proceedings
Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
Conference
6th IEEE International Workshop On DDECS, Poznaň, hotel Trawinski, PL
ISBN
83-7143-557-6
Publisher
Publishing House of Poznan University of Technology
Place
Poznaň, PL
BibTeX 
@INPROCEEDINGS{FITPUB7159,
   author = "Zden\v{e}k Kot\'{a}sek and Daniel Mika and Josef Strnadel",
   title = "Methodologies of RTL Partial Scan Analysis and Their Comparison",
   pages = "233--238",
   booktitle = "Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems",
   year = 2003,
   location = "Pozna\v{n}, PL",
   publisher = "Publishing House of Poznan University of Technology",
   ISBN = "83-7143-557-6",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7159"
}
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