Publication Details

The Test Controller Design Based on I-Path Concept

MIKA Daniel. The Test Controller Design Based on I-Path Concept. In: Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3. Brno: Faculty of Electrical Engineering and Communication BUT, 2003, pp. 624-628. ISBN 80-214-2379-X.
Czech title
Návrh řadiče testu na bázi i-cest
Type
conference paper
Language
english
Authors
Mika Daniel, Ing. (DCSY FIT BUT)
Keywords

Register Transfer Level, I-path, I-mode, Circuit Under Test

Abstract

In the paper the process of the test controller design and synthesis on register transfer level is described. The principle of circuit element access is discussed during the test plan scheduling. The formal tool - a mathematical logic and a set theory - is used as suitable tool for test controller design process. The problem of I-path is explained and a simple example of I-path is also demonstrated.

Published
2003
Pages
624-628
Proceedings
Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3
Conference
ELECTRICAL ENGINEERING, INFORMATION AND COMMUNICATION TECHNOLOGIES 2003, Brno, CZ
ISBN
80-214-2379-X
Publisher
Faculty of Electrical Engineering and Communication BUT
Place
Brno, CZ
BibTeX 
@INPROCEEDINGS{FITPUB7168,
   author = "Daniel Mika",
   title = "The Test Controller Design Based on I-Path Concept",
   pages = "624--628",
   booktitle = "Proceedings of 9th Conference and Competition STUDENT EEICT 2003 Volume 3",
   year = 2003,
   location = "Brno, CZ",
   publisher = "Faculty of Electrical Engineering and Communication BUT",
   ISBN = "80-214-2379-X",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7168"
}
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