Publication Details

Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers

SEKANINA Lukáš and RŮŽIČKA Richard. Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers. In: The 2003 NASA/DoD Conference on Evolvable Hardware. Los Alamitos: IEEE Computer Society Press, 2003, pp. 135-144. ISBN 0-7695-1977-6.
Czech title
Snadno testovatelné obrazové operátory: Třída obvodů, kde evoluční návrh poráží inženýry
Type
conference paper
Language
english
Authors
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY FIT BUT)
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY FIT BUT)
URL
Keywords

digital circuit, evolvable hardware, testability, image operator

Abstract

The paper deals with a class of image filters in which the evolutionary approach consistently produces excellent and innovative results. Furthermore, a method is proposed that leads to the automatic design of easily testable circuits. In particular we evolved salt and pepper noise filters, random shot noise filters, Gaussian noise filters, uniform random noise filters, and edge detectors.

Published
2003
Pages
135-144
Proceedings
The 2003 NASA/DoD Conference on Evolvable Hardware
Conference
The 2003 NASA/DoD Conference on Evolvable Hardware, Chicago, US
ISBN
0-7695-1977-6
Publisher
IEEE Computer Society Press
Place
Los Alamitos, US
BibTeX 
@INPROCEEDINGS{FITPUB7186,
   author = "Luk\'{a}\v{s} Sekanina and Richard R\r{u}\v{z}i\v{c}ka",
   title = "Easily Testable Image Operators: The Class of Circuits Where Evolution Beats Engineers",
   pages = "135--144",
   booktitle = "The 2003 NASA/DoD Conference on Evolvable Hardware",
   year = 2003,
   location = "Los Alamitos, US",
   publisher = "IEEE Computer Society Press",
   ISBN = "0-7695-1977-6",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/7186"
}
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