Test scheduling for embedded systems

The paper proposes two approaches to test scheduling. The first oneutilizes the concept of TACG (Test Application Conflict Graph). For thetesting process the resource utilization model is defined and used forthe TACG construction. Different conflicts that must be taken intoaccount during test scheduling are presented. The paper offers amethodology that can be utilized during embedded test design process,the final goal of which is to reduce the overall test application timeand power consumption during the test application. The secondmethodology is based on optimising the test schedule - the testapplication time, TAM width and power consumption are taken intoaccount during the process. The goal of the methodology is a reasonabletrade-off between these parameters.