Result Details
Methodology of Selecting Scan-Based Testability Improving Technique
        KOTÁSEK, Z.; STRNADEL, J.; PEČENKA, T. Methodology of Selecting Scan-Based Testability Improving Technique. Proc. of 8th IEEE Design and Diagnostic of Electronic Circuits and Systems Workshop. Sopron: University of West Hungary, 2005. p. 186-189.  ISBN: 963-9364-48-7.
    
                Type
            
        
                conference paper
            
        
                Language
            
        
                English
            
        
            Authors
            
        
                Kotásek Zdeněk, doc. Ing., CSc., DCSY (FIT), UTKO (FEEC)
                
Strnadel Josef, Ing., Ph.D., DCSY (FIT)
Pečenka Tomáš, Ing., Ph.D., FIT (FIT), DCSY (FIT)
        Strnadel Josef, Ing., Ph.D., DCSY (FIT)
Pečenka Tomáš, Ing., Ph.D., FIT (FIT), DCSY (FIT)
                    Abstract
            
        In the paper, the solution of the problem of selecting the most optimal design-for-testability technique for register-transfer level digital circuits is demonstrated. A decision-making process that is able to solve the problem over a set of scan-based techniques is presented in the paper. The process decides among following testability improving techniques: identification of testable cores, covering of feedback loops by minimum set of scan registers, selection of registers into scan chains to achieve high level of parallelism during the test application.
                Keywords
            
        design for testability, scan method, testable core
                URL
            
        
                Published
            
            
                    2005
                    
                
            
                    Pages
                
            
                        186–189
                
            
                        Proceedings
                
            
                    Proc. of 8th IEEE Design and Diagnostic of Electronic Circuits and Systems Workshop
                
            
                    Conference
                
            
                    IEEE Design and Diagnostics of Electronic Circuits and systems (DDECS'06)
                    
The 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
            The 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
                    ISBN
                
            
                    963-9364-48-7
                
            
                    Publisher
                
            
                    University of West Hungary
                
            
                    Place
                
            
                    Sopron
                
            
                    BibTeX
                
            @inproceedings{BUT21466,
  author="Zdeněk {Kotásek} and Josef {Strnadel} and Tomáš {Pečenka}",
  title="Methodology of Selecting Scan-Based Testability Improving Technique",
  booktitle="Proc. of 8th IEEE Design and Diagnostic of Electronic Circuits and Systems Workshop",
  year="2005",
  pages="186--189",
  publisher="University of West Hungary",
  address="Sopron",
  isbn="963-9364-48-7",
  url="http://www.fit.vutbr.cz/~pecenka/pubs/2005_ddecs_scan.pdf"
}
                
                Projects
            
        
        
            
        
    
    
        Modern Methods of Digital Systems Design, GACR, Standardní projekty, GA102/04/0737, start: 2004-01-01, end: 2006-12-31, completed
            
        
                Research groups
            
        
                Dependable Digital Systems Research Group (RG DEPSYS)
            
        
                Departments