Publication Details
Evolvable Hardware System at Extreme Low Temperatures
Stoica Adrian (NASA JPL)
Keymeulen Didier (NASA JPL)
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY FIT BUT)
evolvable hardware, extreme low temperatures, functional recovery
This paper describes circuit evolutionary experiments at extreme low temperatures, including the test of all system components at this extreme environment (EE). In addition to hardening-by-process and hardening by-design, "hardening-by-reconfiguration", when applicable, could be used tomitigate drifts, degradation, or damage on electronic devices (chips) in EE, by using re-configurable devices and an adaptive selfreconfiguration of their circuit topology. Conventional circuit design exploits device characteristics within a certain temperature/radiation range; when that is exceeded, the circuit function degrades. On a reconfigurable device, although component parameters change in EE, a new circuit design, suitable for new parameter values, may be mapped into the reconfigurable structure to recover the initial circuit function. This paper demonstrates this technique for circuit evolution and recovery at liquid nitrogen temperatures (-196.6 °C). In addition, preliminary tests are performed to assess the survivability limitations of the evolutionary processor at extreme low temperatures.
@INPROCEEDINGS{FITPUB7878, author = "S. Ricardo Zebulum and Adrian Stoica and Didier Keymeulen and Luk\'{a}\v{s} Sekanina", title = "Evolvable Hardware System at Extreme Low Temperatures", pages = "37--45", booktitle = "Evolvable Systems: From Biology to Hardware", series = "Lecture Notes in Computer Science", volume = 3637, year = 2005, location = "Berlin, DE", publisher = "Springer Verlag", ISBN = "978-3-540-28736-0", language = "english", url = "https://www.fit.vut.cz/research/publication/7878" }