Publication Details

SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System

KOTÁSEK Zdeněk and STRNADEL Josef. SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System. In: Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS). Los Alamitos, CA: IEEE Computer Society, 2006, pp. 497-498. ISBN 0-7695-2546-6.
Czech title
SET: Interaktivní nástroj pro výuku a procvičování principů scan DFT technik a jejich vlivu na parametry vestavěných systémů
Type
conference paper
Language
english
Authors
Kotásek Zdeněk, doc. Ing., CSc. (DCSY FIT BUT)
Strnadel Josef, Ing., Ph.D. (DCSY FIT BUT)
Keywords

scan, design for testability, education, tool, consequence, diagnosis, design, trade-off, constraints, testability, scan chain

Abstract

In the paper, upgraded version of our tool for learning and training of scan design for testability technique principles and its consequences to parameters of embedded system is presented. It is outlined how the tool can be utilized in education process in order to ilustrate relation between design and diagnostic parameters of embeded system.

Published
2006
Pages
497-498
Proceedings
Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)
Conference
13th Annual IEEE International Conference and Workshop on the Engineering of Computer Based Systems (ECBS), Potsdam, DE
ISBN
0-7695-2546-6
Publisher
IEEE Computer Society
Place
Los Alamitos, CA, US
BibTeX 
@INPROCEEDINGS{FITPUB8019,
   author = "Zden\v{e}k Kot\'{a}sek and Josef Strnadel",
   title = "SET: Interactive Tool for Learning and Training Scan-Based DFT Principles and Their Consequences to Parameters of Embedded System",
   pages = "497--498",
   booktitle = "Proceedings of the 13th IEEE International Symposium and Workshop on the Engineering of Computer-Based Systems (ECBS)",
   year = 2006,
   location = "Los Alamitos, CA, US",
   publisher = "IEEE Computer Society",
   ISBN = "0-7695-2546-6",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/8019"
}
Back to top