Publication Details

Formal Model of Testable Block

HERRMAN Tomáš. Formal Model of Testable Block. In: Proceedings of 12th Conference Student EEICT 2006, Volume 4. Brno: Faculty of Electrical Engineering and Communication BUT, 2006, pp. 451-455. ISBN 80-214-3163-6.
Czech title
Formální model Testovatelného bloku
Type
conference paper
Language
english
Authors
Herrman Tomáš, Ing., Ph.D. (DCSY FIT BUT)
Keywords

RT level, Testable block, formal model, scan chain

Abstract

Formal model of a circuit on RT level is described in this paper. The model is used to describe properties of Testable Block. It is indicated how the concept of Testable Block can be used to reduce RT level test application time by decreasing the number of register included into scan chain.

Published
2006
Pages
451-455
Proceedings
Proceedings of 12th Conference Student EEICT 2006, Volume 4
Conference
Student EEICT 2006, Brno, CZ
ISBN
80-214-3163-6
Publisher
Faculty of Electrical Engineering and Communication BUT
Place
Brno, CZ
BibTeX 
@INPROCEEDINGS{FITPUB8051,
   author = "Tom\'{a}\v{s} Herrman",
   title = "Formal Model of Testable Block",
   pages = "451--455",
   booktitle = "Proceedings of 12th Conference Student EEICT 2006, Volume 4",
   year = 2006,
   location = "Brno, CZ",
   publisher = "Faculty of Electrical Engineering and Communication BUT",
   ISBN = "80-214-3163-6",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/8051"
}
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