Detail publikace

The Unified Approach to Processor Testing

DRÁBEK, V. The Unified Approach to Processor Testing. CE&I, Sci. Conf., Košice-Herlany, Slovakia. Košice-Herlany: unknown, 1999. p. 192-195. ISBN: 80-88922-05-4.
Typ
článek ve sborníku konference
Jazyk
anglicky
Autoři
Drábek Vladimír, doc. Ing., CSc. (FIT)
Abstrakt

The focus is concentrated on different design for testabilityapproaches being used on current processors as full scan, partial scan,standard boundary scan, and so on. An unified approach to processortesting is being proposed, combining several optimised DFT techniques,formal verification and system-level testing.

Rok
1999
Strany
192–195
Sborník
CE&I, Sci. Conf., Košice-Herlany, Slovakia
ISBN
80-88922-05-4
Vydavatel
unknown
Místo
Košice-Herlany
BibTeX 
@inproceedings{BUT192309,
  author="Vladimír {Drábek}",
  title="The Unified Approach to Processor Testing",
  booktitle="CE&I, Sci. Conf., Košice-Herlany, Slovakia",
  year="1999",
  pages="192--195",
  publisher="unknown",
  address="Košice-Herlany",
  isbn="80-88922-05-4"
}
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